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MBE Systems
III-V or II-VI MBE Systems
Nitride MBE Systems
Oxide MBE Systems
Silicon MBE Systems
Laser MBE Systems
Metal Organic Chemical Vapor Deposition Systems
MBE System Components
Cluster Tool
Sample Manipulator
Source Shutters
Process Software
Cleaving Tool
Atomic Layer Deposition Systems
Pulsed Laser Deposition Systems / Laser MBE Systems
SMART™ Thin Film Deposition Systems
Deposition Sources
RF Plasma Sources
Effusion Cells
Valved Sources and Cracking Sources
Electron Beam Evaporators
Gas Injectors
Atomic Hydrogen Source
Photovoltaic Thin Film Deposition Sources
Thermal Linear Deposition Sources
Valved Deposition Sources for PhotoVoltaic Applications
Thin Film Process Monitoring
Substrate Temperature Monitor - AccuTemp™
Frequently Asked Questions for the In-Situ 4000 Process Monitor
Application Checklist to Ensure Process Compatibility
AccuFlux™ Deposition Flux Monitor
RHEED
In-Situ Cathodoluminescence
Application Laboratory & Wafer Services
UV Detectors
SVT Associates is a world
leading manufacturer of
Molecular Beam Epitaxy
systems and other Thin
Film Deposition Equipment.
Application Checklist to Ensure Process Compatibility
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Checklist Questions
General process type: (e.g., MBE, MOCVD, VPE, etc.)
Deposition chamber manufacturer & model number (Observation Geometry), view-port diameter, and material:
Substrate material: (e.g., Silicon, GaAs, etc.)
Substrate size & thickness:
Film material structure:
Deposition rates:
Substrate temperature range of interest:
How is the substrate heated? (e.g., conductive, radiative, etc.)
Which of the following are required monitor parameters?
Substrate Temperature:
Yes
No
Film Thickness:
Yes
No
Film Index of Refraction:
Yes
No
Does the substrate move during deposition?
Yes
No
Is there clearance for the optical head (125 x 125 x 150 mm) near the viewport?
Yes
No
Are there other sources of light or heat in the vacuum chamber? (e.g., filaments, effusion cells)
Please add any comments, sketches, or notes:
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